In-circuit
See Also: Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
Tecap Automated Test Suite
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Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements
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Product
Microprocessor Development System
DS-48
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# Real-Time and Transparent In-Circuit Emulator# Supports Philips Telecom Derivatives# Adaptable to 8051 Derivatives# Emulates 1.5V to 6V Microcontrollers# Maximum Frequency of 40MHz# 8K of Internal Memory# DOS and MS-Windows Debuggers# 32K Trace Memory and Logic Analyzer "on the Fly"# 8K Hardware and Conditional Breakpoints
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Product
Flying Probe Tester
Condor MTS 505
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Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Product
USB Male A to Male Mini B Cable (length 12″)
SKU-043-07
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12″ inch Male-A to Male-B mini USB cable. Use this cable to connect In-Circuit Programmer/Loader to your host PC.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
Multi-Stage In-Circuit Test Fixtures
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
Atlas ESR PLUS - Equivalent Series Resistance Meter
ESR70
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The Atlas ESR provides instant measurement of a capacitor's ESR and it's capacitance value. Using the supplied gold plated probes (removable), the Atlas ESR can measure ESR down to a resolution of 0.01 ohms, up to 40 ohms. It can even measure ESR for capacitors that are in-circuit. Measurements are made at the industry standard frequency of 100kHz. Probes are now removable, allowing 2mm compatible probes to be fitted. Audible alerts are produced for various ESR levels allowing you to perform many tests in succession without having to look at the display.
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Product
Active Differential Probe, 100 kHz to 12 GHz
U1818B
High Frequency Probe
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Product
Programmable Parametic Tester
IST 878
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IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
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Product
TestStation Automated Inline Handler | In-Circuit Test Solution
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Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
In-Line Full Automatic Testing System
ALMAX
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Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Product
In-Circuit Test Applications
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With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Generates Test Cases on ICE
TrekSoC-Si
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TrekSoC-Si automatically generates self-verifying C test cases to run on the embedded processors in SoCs in in-circuit emulation (ICE), FPGA prototyping, and production silicon. This verifies your chips more quickly and more thoroughly than hand-written diagnostics or running only production code on the processors. TrekSoC-Si's generated test cases target all aspects of full-SoC verification and work in a variety of different environments. TrekSoC-Si is a companion to TrekSoC, which generates test cases for simulation and acceleration. TrekSoC-Si extends the benefits of TrekSoC into hardware platforms.
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Product
Digital Incircuit Test
PFL780/760
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The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Product
ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Product
Deep And Sloped Pan Fixtures
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Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Product
Hardware Debug Interface & Stand Alone Programmer
Cyclone PRO
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P&E Microcomputer Systems' Cyclone PRO is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale HC08, HCS08, HC12, HC(S)12(X), and RS08 microcontrollers. Now featuring support for Freescale's ColdFire V1.
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Product
Test plug
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ENGMATEC produces industrial, highly wear-resistant contact plugs for in-circuit and functional tests. They have been specially developed for a very large number of test processes, as they often occur in a wide variety of industries in the production process.
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Product
68HC(S)12 In-Circuit Debugger
ICD12Z
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P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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Product
68HCS08 In-Circuit Debugger
ICDHCS08
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P&E's ICDHCS08 is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
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Product
Universal LightProbe S2 Sensors
LED Sensor
Optomistic Products’ Universal LightProbe S2 Sensors are designed for the In-circuit, Functional or Finished Product test of an LED’s color and/or intensity. Implemented in a unique and customizable 2-Part solution, the S2 Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.
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Product
Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Product
Switching Matrix
MUX
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The Analog Signal Switch Unit serves as a 6-bus interconnect for 128 pins each to the Analog Measurement Unit (AMU05) for the In-Circuit test.
