In-circuit
See Also: Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
In-Circuit Test Fixture Design Services
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An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
In-System Programming (ISP)
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Modern assemblies today usually require on-board or in-system programming. The in-system programming (ISP) on the in-circuit test adapter represents the ideal solution for optimizing processes in ongoing electronics production.
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Product
PXI Test Instrumentation
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The Yelo Pixi general purpose tester is a PXI based functional test system with in-circuit and continuity capability. Built into a free standing 19” rack is a PXI chassis, mass interconnect fixture interface, PC, flat screen and space for additional user selectable instrumentation.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Advanced Test Module
SYSTEM 8 (ATM)
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The Advanced Test Module (ATM) is a solution designed for the test and diagnostics of all logic PCB assemblies, from single component testing in-circuit up to complete assembly functional checks.
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Product
New Generation Vacuum Box for the 3070 Test Platform
Vortex Series
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The Vortex Series is a new generation vacuum box for the 3070 test platform that will easily revolutionize in-circuit test. The simplified and streamlined design allows for maximizing the usable testable board size of the Vortex 100 Performance Grade fixture. The rugged all aluminum design maximizes the opening angle of 85° ideal for Cobot usage, while eliminating the top plate and associated hardware and retaining our classic quick plate guided probe technology.
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Product
Spring Probes & Hyperboloid Contacts
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In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
In-circuit ESR Meter
Capacitor Wizard
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The Capacitor Wizard® finds bad capacitors IN CIRCUIT by measuring a capacitor's ESR (equivalent series resistance). A good capacitor should have very low ESR. Weak and bad capacitors have much higher ESR. The Capacitor Wizard® will SPEED UP YOUR REPAIR.
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Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Offline In-Circuit Test Solutions
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TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
ISP Programmer Superpro Is01
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Features:Until now,Support IC manufacturer, pcs devices and keeps growing.1)High speed thanks to the flexible hardware engine. Programming speed adjustable for complicated application environments brought by user target board, length of ISP cable etc.2)Stand-alone and PC-Hosted (USB2.0 High Speed) dual mode;3)Supports ISP programming of devices with I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 and any other serial port.4)ATE interface;5)Over-current and ESD protection to protect your equipment;6)DLL and API for easy integration into customers’ system.Hardware Specifications:1) ISP cable integrates I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 interfaces。2) VDD (0-5.5V /0.5A) and Vpp (0-15V / 0.2A) lines provided to power the target board and the target devices.3) Cable driver circuit supports target devices of voltage level 1.5-5V and is ESD protected.4) USB 2.0 (high speed) interface for PC hosted mode and management of project files on SD card.5) A 20 Characters x 4 lines LCD and a 6-key keypad are built with it for stand-alone operation. In stand-alone mode project files are stored on the SD card (up to 16GB). The number of the project files is limited only by the capacity of the SD card.6) ATE interface is built for easy external hardware control. 6 lines SEL0-SEL5 are for project selection (maximum 64 files); 2 command lines START and STOP; 3 STATUS lines PASS, FAIL and BUSY. All signals are optical-isolated.7) A universal AC adaptor of DC12V/2A is included for power supply.8)WINDOWS XP/Vista/Win7/Win8/Win10 32/64bit compatibility.Software Specifications:1) Supports almost all devices with ISP interface.2) Supports Jam and Staple files from ACTEL and ALTERA; Direct C files from ACTEL.3) Programming speed selectable (High, Normal and Low) for complicated applications such as different cable lengths, different target load characters.4) Dynamic buffer function. Application examples include device S/N, MAC address, frequency or transducer calibration etc.5) File format on SD: FAT16, FAT32.6) Functions for IP protection: Project security, SD security, batch control, administration management etc. 7) API and DLL provided for easy integration into customers’ system like ICT and ATE.8) Software provides the features for multiple units to work concurrently controlled by USB HUB.Applications:1)R&D application like in-circuit test and debug.2)Volume production. Devices may be programmed after the board is fully assembled. One example is the serial number writing to an on-board serial device.3)Field application. Comes with portability, stand-alone mode and mobile data storage media (SD card), it is suitable for field test, debug and data acquisition.4)Third application modules. Friend s/w interface (DLL and Virtual Com communication command set) and h/w interface ( ATE and USB) are provided and make it very easy for customers to integrate ISP01 as a functional module into their systems. One example is the ICT equipment. With this integration user can finish in-circuit test and in-circuit programming in one step.
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Product
Manufacturing Defects Analyzer
eloZ1-1600
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
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Product
CPU3xx Incircuit Debugger
ICD32Z
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P&E's ICD32 for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
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Product
Automated Test Equipment
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Smart, swappable fixtures and flexible test bedsMulti-site setups, including multi-threadingLong-wire, short wire, and wirelessBed-of-nails for in-circuit testing (ICT)RF, high-speed digital, and thermal designsSolidWorks design expertise and global manufacturing (e.g., US, Mexico, China)Multiple options for mass interconnects (VPC, MAC Panel) and harnessesBuilt-in self-test (BIST) fixtures and calibration tools
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Product
In-Circuit Debugger for Power Architecture 55xx/56xx (Nexus)
ICDPPCNEXUS
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P&E's ICDPPCNEXUS for Windows is a powerful tool for debugging code on a Freescale MPC55xx/56xx processor. The debugger comes with P&E's PROGPPCNEXUS flash programmer.
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Product
PXI FlexRay Digitizer
PXD7113
Digitizer
Digitize high resolution waveforms with the fully isolated PXD series Digitizers. Minimize interference and measure "in-circuit". Measurement errors are reduced by a high input impedance.
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Product
Microprocessor Development System
DS-85
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* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Product
Test Points
TestStation LX2
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TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
RealProbe RF Probes
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Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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Product
PXI Waveform Digitizer
PXD731x/70xx
Waveform Digitizer
Digitize high-resolution waveforms with the fully isolated PXD Series digitizers. Minimize interference and measure "in-circuit" within circuits. Measurement errors are reduced by a high input impedance.
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Product
TAP Signal Isolation Module
JT 2139
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The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..
