Surface Contamination
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Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Surface Contamination Monitor
IMI Inspector Alert™ V2
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The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Spectrometers
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Search and detection of gamma radiation sources with automatic identification of the radionuclide composition; Measurement of the dose rate of gamma radiation; Detection of neutron radiation and measurement of the neutron count rate (AT6102); Measurement of the dose rate of neutron radiation (external detection unit BDKN-03); Measurement of the flux density of alpha and beta particles from contaminated surfaces (external detection units BDPA-01 / BDPB-01)
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Surface Contamination Kit
138/2
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The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Surface Quality Monitors
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PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Product
Geiger Counter
ONYX®
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ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
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Optical 12,000 Meter Connector
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Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
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Product
Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
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Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Analytical Techniques
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Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
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Elcometer Bresle Patches
135B
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Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Product
Omicron Fiber Optic Connector
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Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
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Molecular Contamination
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Ion mobility spectrometers detect and alert users to small concentrations and changes in airborne levels of chlorides, acids, amines, and ammonia-containing species.
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PuroMaxx Contamination Control
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Brooks offers the industry’s most advanced suite of FOUP carrier/reticle pod cleaners and photomask/reticle stockers. Using state-of-the-art humidity control along with in-situ metrology, our products address all critical airborne molecular contamination, productivity, and process stability challenges at sub20-nm nodes.
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Product
Fluid Contamination Test
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Fluid contamination testing determines the abilities of materials to withstand the contaminating fluids, to which they are exposed in service.
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Product
Ionic Contamination Test Equipment
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For manufacturers driven to deliver quality products, SCS Ionic Contamination Test Systems are the industry standard, delivering accuracy and performance in a range of configurations.
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Contamination Detection and Analysis
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Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
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Contamination Monitors
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Control of X-ray and gamma radiation personal dose equivalent.The dosimeter together with the PC reader and the software forms an efficient automatic system for staff radiation exposure control.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Surface Analysis
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A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Product
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Surface Analysis
InSight-450 3DAFM
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Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
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Product
Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Ionic Contamination Test Systems
CM+ Series
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The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Product
Surface Profile
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Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Product
Surface Thermometers
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Tel-Tru® Manufacturing Company
Tel-Tru Surface Thermometers are designed to measure surface temperatures on a wide variety of surfaces and are available in several configurations.
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Product
Skin Surface Probe
SST-2
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The SST-2 skin surface temperature probe for humans, with convenient plastic handle. Probe re-useable and has a fast response time.
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Product
Rotary Surface Grinders
IG Series
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Our rotary surface grinders have evolved by meeting the needs of customers in fields as diverse as electronics, aerospace, photonics, and metalworking. The surface finish on a DCM grinder is similar to Blanchard® grinders by Bourn & Koch, but that is where the similarities end.
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Product
Surface Profile Gauge
123
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The Elcometer 123 Surface Profile Gauge is an easy to use analogue gauge which measures the peak-to-valley height of a blast cleaned surface in a similar way to the Elcometer 224 Digital Surface Profile Gauge.
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Product
Surface Resistance Meter
WL MIDGET
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WL MIDGET Surface Resistance Meter is an ultra-wide range, battery operated, portable instrument for measuring Surface Resistivity and Resistance to Ground of virtually any flat surface conforming to ASTM D-257 standard method by using recommended parallel bar sensing probe. Gives simple, repeatable measurements of conductive, static dissipative, and insulative surfaces. Ranging is automatic due to the use of high-speed OP-AMP Integrated circuits being linear, with changeover points +1/2 decade on a logarithmic scale. Repeatability equals + 5%.
