Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Force Sensors
FlexiForce
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FlexiForce™ force sensors can measure force between almost any two surfaces and are durable enough to stand up to most environments. Our sensors are available off-the-shelf for prototyping or can be customized to meet the specific needs of your product design and application requirements. See below for sensor specifications.
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Force Sensors
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HBK Force Sensors and Force Transducers with strain gauge or piezo technology measure static and dynamic tensile and compressive loads up to 20 MN - with virtually no displacement.
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Force Sensors
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The Force Sensors segment includes a broad line of load cells and force measurement transducers that are offered as precision sensors for industrial and commercial use. Typical applications for force sensors are in medical devices (such as hospital beds and medication dosing), agricultural equipment (for precision force measurement), and construction machinery (for tipping and overload protection). These sensors use our foil technology products, which serve as sensing elements and components within each unit. Further integration of our load cells technology is also offered as part of our weighing module products, which provide customers with a complete sensor assembly that may be used within a wide variety of digital transducers.
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Force Transmitter
LKVE/i
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The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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NanoFluorescence Microscope
NFM
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The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
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Heating Microscope
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Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Microscopes
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Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Force Testers
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Imada has many pre-configured test systems for dedicated testing of a particular force testing application. Cant find your application? Contact us and speak with one of our engineers.
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Portable Video Microscope
Cl-1000
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Video microscope system ideal for installation site. Enables the user to inspect mounted connector endface from the other side of adapter.
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Microscope Cameras
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High-performance USB microscope cameras with the latest SONY global and rolling-shutter sensors and advanced feature sets such as external trigger and readout functions.
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Mechanical Force Gauges
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AMETEK Sensors, Test & Calibration
The mechanical force gauges from Chatillon offer high precision compression testing (Push) and tensile testing (Pull) at a low cost on a wide range of testing applications.
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Force Sensors
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Is defined as a transducer that converts an input mechanical force into an electrical output signal. Force Sensors are also commonly known as Force Transducers.
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Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Temperature Forcing System
ETF-SERIES
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Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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Digital Microscopes
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Zarbeco Digital Microscopes include Video toolbox PC software for taking still and moving images, measurement, labelling, draw-on features. They will have the best image quality at an affordable price with magnification options, digital camera options, and software options to meet your imaging needs.
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Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Eyepiece-less Stereo Microscopes
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Vision Engineering’s eyepiece-less stereo microscopes are better for users and for business. Their ergonomic design lets the operator sit back in a comfortable position, and the expanded pupil technology delivers an enhanced 3D view of the subject. The relaxed natural posture makes it easy and to work with tools and to manipulate the subject. Greater comfort and ease of use directly translate into greater productivity and quality.
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Analog Force Gauges
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Phase II force gauges are designed and engineered to achieve WORLD-CLASS tension/compression measurements. Heavy duty construction allows the force gauges to undergo rough handling in any environment, while providing for extremely sensitive and highly accurate readings. The Phase II force gauges include a direct dual scale reading in both lbf and kgf, eliminating the need for two separate gauges in the shop.
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Atomic Spectroscopy
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Tens of thousands of installations worldwide rely on PerkinElmer spectrometers to obtain accurate results from inorganic elemental analyses quickly, efficiently, effortlessly. No matter what your field, application or sample type, we have the tools and expertise to help -- all based on more than 50 years at the forefront of atomic spectroscopy technology. Take advantage of our complete array of solutions for unparalleled performance, accuracy, and confidence.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
