Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Microscope Software
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Discover more with Olympus microscope software. With intuitive operations that offer a seamless workflow, Olympus microscope software supports your ever-evolving research needs.
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Quartz Impact Force Sensors
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Impact-style sensors are specifically designed for impact force measurements. The sensor is typically mounted in a free-standing manner with the installed impact cap directed toward the oncoming object with which it will collide.
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High Force Type Spring Probes
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Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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High Resolution Microscope for Multi-fiber Connector
D SCOPE MT
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The new D SCOPE MT microscope for MTP/MPO connectors is the fastest on the market. In the same measurement cycle, D Scope MT checks every optical fiber surface condition, and allows the operator to control the cleanliness of the connector endface and guideholes.
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Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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3-Component Quartz Force Rings
260 Series
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Three-component quartz force ring sensors are capable of simultaneously measuring dynamic force in three orthogonal directions (X, Y, and Z). They contain three sets of quartz plates that are stacked in a preloaded arrangement. Each set responds to the vector component of an applied force acting along its sensitive axis. 3-component ring force sensors must be statically preloaded for optimum performance. Preloading provides the sensing elements with the compressive loading required to allow the proper transmission of shear forces. Versions are available with ranges up to 10k lb (45k N) in the z-axis (perpendicular to the top surface), and up to 4000 lb (18k N) in the x-and y (shear) axes. Both ICP® and charge output styles are available.
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Axial Force And Torsion Testing Machine
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Evaluation Testing That Approximates Operating Conditions of Materials and Parts - Loading methods similar to actual usage - Allows simultaneous application of axial and torsional loads to samples
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Mechanical Force Gauges
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Imada mechanical force gauges are highly accurate instruments used to test the quality, strength or functionality of component parts or products. Imada mechanical force gauges check both compression and tension (push or pull). Peak force can be captured using the peak indicator needle and the tare ring compensates for the weight of attachments. Imada force gauges are constructed with a heavy-duty metal case and all metal components to enable them to retain their calibration for years with proper care. These mechanical force gauges never need charging or batteries and are intrinsically safe in hazardous environments.
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Digital Vision Microscopes
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Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
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High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Verification Of Maximum Withdrawal Force Test Apparatus
IEC60884 FIG 18
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG 18 verification of maximum withdrawal force test apparatusThis device complies with the requirements of GB 189.1-2008 Figure 18/19, IEC884 Figure 18/19, VDE0620, etc. It is suitable for checking the maximum force required to pull the plug out of the socket and the single pole pin pulled out from the socket assembly. Whether the minimum force required is within the range specified by
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Inverted Light Microscopes
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Inverted microscopes from Leica Microsystems are designed to meet the rigorous demands of life science as well as material science and industrial applications.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
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Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Inverted Raman Microscope
XploRA INV
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The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
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Force Tensiometer
K20
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Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
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Microscope Automation
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Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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Intel® Atom™ E3845 Processor-Based Fanless Embedded Computer
MXE-1400 Series
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ADLINK's new Matrix MXE-1400 series of rugged quad-core fanless computers, feature the latest generation of Intel® Atom™ E3845 processors, delivering outstanding performance with minimum power consumption.
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Benchtop Thermal Forcing System
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Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Motorized Force & Torque Measurement Test Stands
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Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Atomic Spectroscopy
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For the past 40 years, we have provided products to the Atomic Spectroscopy industry that solve laboratory problems and improve the success of our OEM partners. These products include unique sample delivery solutions, sample preparation tools, autosamplers, and solutions to improve sample throughput and detection limitations, among others. In short, we strive to understand the markets our OEM partners serve in order to deliver products that meet their needs.
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Air Force
Alpha 4314 AF
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4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
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Microscopic Melting Point Meter
DRK8030
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Shandong Drick Instruments Co., Ltd.
Heat transfer material is a silicone oil, in full compliance with USP standard measurement method can simultaneously measure three samples, direct observation of the melting process can be measured colored samples.
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19" Fanless Panel PC With Intel® Atom™ X6425E Processor
PPC-419 EHL
Panel PC
19" SXGA TFT LCD with resistive (default)or projected capacitive(by request) touchscreenIntel® Atom™ x6425E quad-core, 2.0 GHz processorFanless, slim designSupports 1 x 2.5" SATA and 1 x M.2 B key slot for expansion1 x PCI/PCIe x1 expansion slotWide operating temperature range (-20 ~ 60 °C/-4 ~ 140 °F)Wide range DC support (9 ~ 32 VDC)1 x isolated RS-422/485 with automatic flow controlDual 2.5GBASE-T Ethernet supports Time-Sensitive Network(TSN) technology
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FOV Micro Measuring Microscope 4.0
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The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
