Geometry
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Product
High Impedance Active Probes
7
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Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Product
LED Test Production System
Lumere-LC
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Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Product
Rotating Machinery
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Synchronize rotating machinery data with a corresponding RPM signal to understand the RPM-dependant vibrational behavior of your measurement object. The package includes Order Analysis for performance optimization of your rotating machinery. Create your structure's geometry with just a few clicks to animate the structure's vibration behaviour. This offers the very unique possibility of an Order Operating Deflection Shape (ODS) analysis.
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Product
Custom Probes
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At Eddyfi, we strive to meet the most rigorous requirements. Our expertise, engineers, and manufacturing capabilities enable us to take almost any set of custom inspection requirements — dimensions, diameters, geometries, number of coil rows, topologies — and turn them into practical and high-performance solutions for you.
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Product
ReMesh
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ReMesh is the CAD program, which provides powerful tools for geometry creating, checking and editing. Program has tools to remesh discretely or semi-analytically specified geometry in 3D and has convenient interface for editing geometry manually. Problems with remeshing of such geometries arise in EMC simulations.
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Product
Multibeam Echosounder - Deep Water
SeaBat 7160
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The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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Product
NTSC Standard Pattern Generator
PG315N
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Probe Positioners (Probe Manipulators)
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PacketMicro offers a broad ranges of probe positioners to allow designers to guide standard oscilloscope/TDR/RF/microwave probes onto the small geometries of fine-pitch interconnects, SMD packages, MCMs, hybrids and ICs.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Integrating Sphere Solutions
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An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
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Product
Step Probes
Step Probe
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Product
Probe Card Analyzers
PB6800
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The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
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Product
AM Control System
Clamir
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*Continuous monitoring of melt pool dynamics and geometry.*Ensures quality and repeatability.*Compatible with most laser heads.*Compatible with a wide range of materials.*Easy mechanical integration.*Quick configuration.*Helps to reduce CO2 emissions.
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Product
PAL Standard Pattern Generator
PG315P
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Optical CMM Systems
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Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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Product
Drawing Die And Wire Measurement
DGMS – Die Geometry Measuring System
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Optik Elektronik Gerätetechnik GmbH
Measuring system for diameter, roundness, reduction angle and bearing length of wire drawing dies.
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Product
Manual Spin Rotary Table for Optimal Circular Geometry (TIR) Inspection
TruMotion
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Rotary Precision Instruments UK Ltd
Inspect circular components in a shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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Product
Refractive Index Profiler
S14
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The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Product
HyMPulse Pulsed Field Magnetometer
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Metis Instruments & Equipment NV
Geometry independent M-measurement (patent pending): One probe fits all, no pole shoes per magnet geometry. Measure the actual magnet instead of a prepared standard size sample. Measurement of industrial shapes like segments, cylinders, bricks,... with one probe
