Transceiver Test
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Product
Transceiver Driver
S-112
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Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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Product
OSFP 800G
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OSFP800 has emerged as a leading standard to drive the development of 800G ecosystem. The MultiLane OSFP800 development kit is an essential tool to ensure the validity of your OSFP800 products. The module compliance board (MCB) is used to test transceivers, AOCs, active cables and DACs, while the host compliance board (HCB) enables the testing of system host ports. The loopback modules (LB) provide an economical way to test thermal capacity and signal integrity of system host ports at every stage of the process: R&D validation, production testing, and field testing.
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Product
4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
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The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Product
Transceiver Testing
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Family of RF test systems designed for transceiver testing. Designed for radio-to-radio testing in a closed mesh network. Step attenuators allow you to dynamically fade up/down the RF signal between radios. These Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted remote commands.
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Product
Benchtop Femtosecond/Picosecond Lasers and Amplifiers
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The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Product
Gigabit Ethernet SFP Module
SFP-GMM-2K
Optical Transceiver
Hardened SFP/1250-ED, MM1310/LC 2km (also known as 808-38206) Industrial standard small form-factor pluggable (SFP) package, Provides digital diagnostics monitoring (DDM) functionality. Wide specifications and fiber types available, Comes with metal enclosure for EMI.
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Product
PXIe-5785, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO IF Transceiver
785584-02
FlexRIO IF Transceiver
The PXIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PXIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
Hardened SFP+LR/10G-ED, SM1310/LC 20Km
SFP-XSM-LCI-20K
Optical Transceiver
Provides digital diagnostics monitoring (DDM) functionality, Wide specifications and fiber types available, Industrial standard small form-factor pluggable (SFP) package. Comes with metal enclosure for EMI, The Class 1 laser product complies with EN 60825-1, Supports plug-n-play operation.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785587-01
FlexRIO IF Transceiver
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Product
PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver
786853-01
Vector Signal Transceiver
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
PXIe-5860, PXIe, 8.5 GHz, 1 GHz Bandwidth, Dual-Channel RF PXI Vector Signal Transceiver
789449-01
Vector Signal Transceiver
The PXIe-5860 is a dual-channel 8.5 GHz PXI Vector Signal Transceiver (VST) with 1 GHz of instantaneous bandwidth. This VST combines two vector signal generators and two vector signal analyzers into a single two-slot PXI Express instrument. Additionally, the PXIe-5860 provides the high density, fast measurement speed, and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. You can use the VST to perform error vector magnitude (EVM) test for cellular and wireless standards such as Wi-Fi 7 and 5G NR. With the channel density, frequency coverage, and bandwidth availability of the PXIe-5860, you also can perform multisite and multichannel test for a wide range of semiconductor and electronics production applications.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-01
Transceiver Adapter Module
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
