Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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SODIMM DDR3L 1333/1600/1866 With Thermal Sensor
SQR-SD3I
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30u” golden finger, Operating Temperature: -40° C to +85° C, 100% Screening Test. Original chip vendor adopted, EEPROM with Thermal sensor, Burn-In Test.
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Wireless Digital Multimeter 4000 count / NCV / SPT and with Anti Burn Protection
MS-W2034P2
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This is a Palm Size external wireless connectivity Digital Multimeter integrated with 4000 Count, True RMS, auto and manual measurement.
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Product
Automated Production Testing
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Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests.
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Product
Visual Fault Locator
HW-205
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Shanghai Fibretool Technology Co.,Ltd.
The HW-205 is specially designed for field personnel who need an efficient and economical tool for fiber tracing, fiber routing and continuity checking in an optical network during and after installation.- 2.5mm universal connector- Operates either in CW or Pulsed- Constant output power- Long battery life (up to 60 hours)- Laser case ground design prevents ESD damage- Portable and rugged, easy to use- Burning testing to ensure the reliability.- Optional 1.25mm connector adapter
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Product
IEC60695-11-2 Single Wire And Cable Vertical Burning Tester
CX-D12
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Shenzhen Chuangxin Instruments Co., Ltd.
It’s strictly designed according to IEC60695-11-2, IEC60332-1, GB/T18380.11-2008, GB/T18380.12-2008 etc. Stainless steel screen with a sliding burner handle support for approaching or movingback the flame from the sample under test according to the CEI standards for test on cables.
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Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
Environment And Burn-in Temperature Chambers
9000 Series
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Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.
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Fire & Flammability Test
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Fire & Flammability testing: ASTM E119 [UL 263]; ASTM E152 [UL 10C]; ASTM E814 [UL 1479]; API 607, 6A; ASTM E108 [UL 790]; UL 1709; UL 1715; UL 2043; NFPA 286; UBC 26-2; UBC 26-3; ASTM E84 [NFPA 255, UL 723]; ASTM E162; ASTM E662 [NFPA 258]; ASTM D635; ASTM D1929; ASTM D2863; ASTM E1354; ASTM E1317; Room Burn Facility; CAL 133, 117, 129; UL 94 V/HB; IMO A.652 (16); IMO A.653 (16); ULVW I; ASTM D2859; AITM 2.0007; NFPA 701; FMVSS 302; FAA 25.853; IEEE 383
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Product
DIN75200 Interior Fabric Horizontal Burning Test Equipment
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Shenzhen Chuangxin Instruments Co., Ltd.
DIN75200 Interior Fabric Horizontal Burning Test Equipment
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Product
Advanced Burn-in and Test System for packaged parts
ABTS-Li
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High power logic individual temperature control
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
LED Burn-In Test
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Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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Fuel/Other Analyzers
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Our products are used to test fuel in a couple of ways. Fuel blending is the process of ensuring a fuel has the desired composition in terms of relative concentration of components. Testing fuel for contamination ensures that the equipment that burns the fuel will not suffer damage from impurities in the fuel.
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Product
BGA Sockets
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Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Product
6 Chip Detection and Burn Channels
CD1
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The CD1 provides 6 Chip Detect and Fuzz Burn interface(s). A Chip Detector (CD) is a magnetic-electrical device that provides a reliable method of detecting impending failure of bearings and gears.
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Flame & Other Plastics Testing
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Educated Design & Development, Inc.
Plastics are tested to determine their flammability burning characteristics (Flame rating), their ignition potential due to thermal and electrical sources, their resistance to electrical tracking, and other electrical characteristics. The specific test required on a plastic depends on the type of component or end-use product, as well as the environment in which the plastic is used. This test equipment meets most UL, CSA, IEC, EN and other international safety standards.
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Product
Horizontal Flammability Tester
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Sataton Instruments Technology CO., Ltd
Horizontal flame resistance tester is design based on FMVSS 302 to determine the burning behavior of materials as interior in motor vehicles by calculating the burning rate of the specimen after ignition by a small flame. Exposed to a certain flame for specified time, the specimen which is clamped in a U shape holder will be measured for the burned distance and time taken to burn this distance. The tester is particularly important for assessing safety of the materials used in the passenger compartment.
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Product
Burn-in and Stress Screening Chambers
KDR
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Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Polarity & Burn in Test Systems
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Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Product
Power-Switching Test System
High Voltage Switching Test System
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The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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DC Electronic Loads
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Electronic Test & Power Systems
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.
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Multisystem Ignition Analyzer
TA500
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The TA500''s unique and proprietary technology allows the user to perform quick and reliable diagnostics of non-starts, misfires, fouled up or damaged spark plugs and/or spark plug wires, by comparing digital read-outs of the spark plug voltage and spark burn time between cylinders on engines using Coil on Plug, Coil near Plug, conventional distributor/ignition coil, DIS (Distributor-less) or waste spark and magneto technologies.
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Low Voltage Burn-in and Test System
Max 450
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For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Product
Loopbacks
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Loopbacck plugs are used for network diagnostics, system configuration testing, and device burn-in. Looping back the signal allows for testing of the optical network.
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Product
High Power Burn-In Test
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Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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High Voltage Switching Test System
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The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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Product
SparkFun Air Quality Sensor
SGP30 (Qwiic)
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The SparkFun SGP30 Air Quality Sensor provides information on the quality of the air in your room or house by monitoring the volatile organic compounds around the sensor. The SGP30 Air Quality Sensor can return valid indoor air quality (IAQ) readings within 15 seconds of powering up! By comparison, typical air quality (IAQ) sensors are great for measuring CO2 and volatile organic compounds (VOCs) but some of them require a burn-in time of 48 hours and a 20-min start up time.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
