Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Life Sciences Applications
LS-AFM
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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
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All-In-One Unit
RH-8800
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"RH-8800" is an All-In-One digital microscope, which enables intuitive and comfortable operation by integrating "Observation", "Recording", "Measuring", together as one.
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Easycheck Fiber Endface Inspector
CA3002
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The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Microscope Cameras
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In contrast to digital cameras for normal photography, microscope cameras are built to meet the demands of high-end science- and research applications. For maximum light sensitivity they use large CCD or CMOS sensors for image acquisition. Color reproduction is often critical, why features like Microscanning or Color-Co-Site Sampling ensure optimal image quality. Due to the lack of a light absorbing color filter monochrome microscope cameras for fluorescence imaging are even more sensitive.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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AFM Atomic Force Microscope
FM-Nanoview 6800
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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Micro Vickers Hardness Tester
900-392
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The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Analytical Probe Station with Laser Cutting System
LCS- 4000 Series
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The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
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Compact Manual Laser Repair System
LRS-2400
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LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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IndiRAM CTR With Quantum Characterizer
Spectrometer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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HiCAM Fluo
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The HiCAM Fluo is a high-speed camera for fluorescence imaging applications. It records high resolution images at a frame rate of up to 2000 fps in the most challenging low-light conditions by using a cooled image intensifier. Packed into a compact aluminum enclosure, it is easy to attach the HiCAM Fluo to any fluorescence microscope.
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Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Inspection Systems
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Video Inspection Systems with?or without measurement capabilities are an excellent way to evaluate and test small items or items in?difficult to access locations. Many options are available in addition to the measurement capability. Video Inspection is used for a variety of purposes including the ability to see? and measure items that are much smaller than the eye can see or that hand tools can measure. Video systems can also reduce the eye and/or back strain associated with production environments where an operator must look in a microscope all day.
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Scanning Probe Microscopes
attoMICROSCOPY
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The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Nano Particle Size Analyzer
SALD-7500nano
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Delivering 10 times the sensitivity of previous models, this innovative analyzer is capable of continuously measuring changes in particle size and particle size distribution at one-second intervals, within a range spanning 7 nm to 800 μm. In addition, unique options that accommodate the measurement of even high-concentration samples (up to 20 wt%) and trace quantity samples (down to 15 μL) are available. Due to its leading-edge measurement capabilities, the analyzer will likely be used for many applications in new areas, including nanotechnology, the life sciences, and fine bubbles (microscopic bubbles).
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Image Analysis Software
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Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
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NanoLattice Pitch Standard (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Inverted Microscope Systems
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Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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SAM Line
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PVA TePla Analytical Systems GmbH
The SAM Line offers easy-to-use scanning acoustic microscopes for process control and quality assurance as well as for research applications. The individual models are derived from a component platform that complies with industry standards and incorporates cutting-edge production and manufacturing technologies. Thanks to their new high-frequency and transducer technology, our acoustic microscopes enable detailed acoustic analysis in the ultrasound range up to 400 MHz.
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FOV Micro Measuring Microscope 4.0
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The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
