Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
-
Product
Portable Microscope With XY Stage, X150 2mm Field Of View
-
*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
-
Product
Microscope Automation
-
Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
-
Product
Temperature Controlled Microscope Stage
-
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
-
Product
Microscopy Image Analysis Software
analySIS FIVE
-
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
-
Product
Your High-performance Slide Scanner For Fluorescence, Brightfield And Polarization
ZEISS Axioscan 7
-
Digitize your specimens with Axioscan 7 – the reliable, reproducible way to create high-quality virtual microscope slides. Axioscan 7 combines qualities that you would not expect to get in a slide scanner: high speed digitization and outstanding image quality plus an unrivaled variety of imaging modes are all available in a fully automated and easy to operate system.
-
Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
-
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
-
Product
Light Source
pE-300white
-
CoolLED's pE-300white offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. The pE-300white Light Source can be fitted directly to the microscope or specified with a liquid light guide. The system is a mercury-free alternative that is safer, more controllable, and repeatable than conventional high-pressure gas discharge illuminators. Spectral coverage is from the UV (DAPI excitation) to the Red region (Cy5 excitation). The system is perfect for hospital and regular research laboratory environments.
-
Product
Measuring Microscopes, Image Processing
Measuring Microscopes
-
Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
-
Product
Atomic Force Microscopy
-
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
-
Product
Atomic Force Microscope
LensAFM
-
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
-
Product
Smart G-Scope
-
Dou Yee Enterprises (S) Pte Ltd
Auto focus digital microscope & telescopeReal fast auto focus by using liquid lensInfinity(x10) ~ Contact (x250) hole area auto focus by changing mode switchAuto focus & manual focus functionChangeable various End caps to support 3pi coner end capHigh luminance OLED displayInfrared wireless controlSupport Android & Windows (XP, Win 7, Win 8)Various image filters & digital zoom functionSpecial design for portablility (aluminum case) No battery neededProvide software for Android and PC
-
Product
Microscopic Melting Point Meter
DRK8029
-
Shandong Drick Instruments Co., Ltd.
Determination of the melting point of the substance. Mainly used for the determination of drugs, chemicals, textiles, dyes, perfumes and other organic crystal, the microscope. Measured either by capillary method, and the slides are available - coverslip (hot stage method).
-
Product
Optical Fiber Microscope
-
Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
-
Product
Matrix Vapor Deposition System
iMLayer
-
The iMLayer matrix vapor deposition system is sample pretreatment (application of matrix) in order to perform MALDI-MS imaging using an analysis system such as the iMScope imaging mass microscope or the MALDI-7090. With the iMLayer, the deposition method has been adopted as a pretreatment method to achieve high spatial resolution. By using this method, fine matrix crystal can be produced. Also, thanks to automated control, the coating thickness is reproducibly controlled as users configure.
-
Product
Electrical Probe Systems
-
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
-
Product
Nanopositioning Stage & Controller
PInano
-
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
-
Product
Atomic Force Microscope
HDM Series
-
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
Product
TOC-L For Monitoring A Microscopic Algae Biomass
-
Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
-
Product
Bench-Top Macroscopic Raman Spectrometer
Modular Raman Microscope
-
HORIBA’s modular Raman spectrometers allow the user to have a flexible Raman system to handle high performance spectroscopy at a price to fit most budgets. The modular microscope can also be used with a range of sampling options, including remote probes. A Raman spectrum recorded with a fiber-coupled Raman microscope of acetaminophen is shown below.
-
Product
Microscopes
-
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
-
Product
AOI Handlings System
-
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
-
Product
Scanning Probe Microscope
SPM-9700HT
-
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
-
Product
Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
-
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
-
Product
E-Beam Power Supplies
-
Maximize image quality and repeatability. Designed for scanning electron microscope tools, Advanced Energy’s precision e-beam technologies deliver impressive performance, accuracy, and reliability.
-
Product
Metallographic Analyzer
MDS-5000D
-
Wuxi Jinyibo Instrument Technology Co., Ltd.
1) the Integrated T -shaped Mirror Design, PROVIDING Superior Stability 2) Low-position Front Operation, Ergonomic requirements . 3) 6V / 30W Adjustable Halogen LAMP, PROVIDING Ample Bright Lighting System . 4) 3/8 splitting of Tube The trinocular , Observation and photography can be carried out simultaneous 5) Low-position mechanical moving platform to quickly locate the image 6) Professional flat-field metallographic objective lens, providing good resolution and clear image 7) Polarization Detecting partial inserts, related polarized light observation mode 8 )Five-hole rotary disc type color filter, easy to operate and switch 9) Adjustable field of view diaphragm and aperture diaphragm, providing good contrast metallographic analysis software system CCD camera will The optical image from the microscope is converted into a video signal, and the Sample image under the microscope is input into the computer through the image acquisition card / digital camera, and the digital image is processed and measured by the software, and finally the image and the measurement result are printed. Back up images and measurement data. General system:General image processing functions: image acquisition, data backup, depth of field expansion, grain boundary reconstruction, image stitching, image calculation, filtering, Image annotation, image segmentation and processing, accurate printing. Professional analysis system: 1. Rating: based on inspection Standards, more than 200 software functional modules in more than 100 categories.
-
Product
LED Illumination Systems
pE-100
-
The pE-100 series is a mercury-free family of compact and simple to use LED illumination systems which can be configured to deliver light directly to a microscope, or via a liquid light guide or multimode fiber. Systems can be specified at any one of 20 different LED wavelengths. Operation is by a remote manual control pod with instant on/off and intensity control from 0-100%. Remote control is available via a TTL trigger.
-
Product
Nanolattice Standards for Analytical Instruments
-
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
-
Product
Particulate & Source Analysis System
-
Encompass the identification of microscopic particles.
-
Product
Stereo Microscopes
-
Sometimes called dissecting microscopes, stereo microscopes provide comfortable 3-dimensional viewing of a sample in which each optical path (eye) sees the sample from a slightly different angle. Stereo microscopes are used to observe and manipulate samples in disciplines such as research, assembly and manufacturing, gemology and jewelry making, sample preparation and, of course, dissection. ACCU-SCOPE stereo microscopes can be found across a wide range of industries and institutions including biology labs, universities, research institutions, government facilities, biopharmaceuticals, manufacturing facilities, and more. Stereo microscopes are also available on a variety of stands and with a variety of illumination sources, offering features that may be particularly suited for your application.
-
Product
3D Optical Microscopy
-
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
