Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
CMM Contact Measurement (Probing)
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A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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Topside Probing for Functional Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Robotic Probing of Circuit Cards
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System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Product
Magnetic Probing Systems
MPS-C-300 and MPS-C-350
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MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Product
Vacuum Probing Systems
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Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Product
Ultra High 3.83 (109.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-72J-10
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72T38-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1F-9.6
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25T36-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-62H-2
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Brute High Current Probe
P4301-2R
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Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1J-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72I-8
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3T-2
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1C-1
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40A-024
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Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1E-1
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25T36-6
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25I35-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1I-2
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Flicker Measuring Probe for LCM ATS
A712306
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The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72H-2
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1T1-10
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
3 Phase Flexible AC Current Probe
DRP 503/18
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The new DRP 503/18 is a 3 Phase Flexible AC current Probe utilising the Rogowski principle, with 3 channel integrator housed in DIN Rail Mounted Enclosure. The flexible and lightweight measuring head allows quick and easy installation in hard to reach areas and with large conductors.
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2D-2
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
