Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Power Device Testing System
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Devices that control electric power, and are used in automobiles and a wide range of electrical products.
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288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Input Devices
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In fact, our in-house electronics production capabilities, incorporating the most advanced technological trends, streamline and ease our customers’ ability to bring their concepts and designs to fruition. From complete assembly through automated placement of components on foil, our automated production machinery brings precision and reliability to the production process, while skilled manufacturing staff oversee and control all aspects of manufacturing. Post-production inspection then ensures that our – and our customers’ – highest standards are met.
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SpaceWire EGSE & Device Simulator
312
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The SpaceWire EGSE & Device Simulator is a programmable hardware unit designed specifically for generating sophisticated test schedules involving precision timing and creating accurate real-time simulations for SpaceWire enabled instruments.
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Certified Medical Devices
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ADLINK Healthcare offers medically-certified medical panel computers, medical monitors, tablets, and HDBaseT™ technology for healthcare digitalization. We support the medical visualization chain from image acquisition through to image analysis and processing, digital data exchange, and image display. Our medical devices are hygienically designed and satisfy safety regulations. We also provide comprehensive services, including customization, consultancy, and technical support.
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Serial To Ethernet Converter & Device Server
SERIP-100
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SERIP-100 is proconX' low-cost Industrial device server offering one or two software selectable RS-232/422/485 serial ports and a 10 Mbit Ethernet port.
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IVN-8561, Automotive Ethernet Interface Device
786169-01
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2-Channel, 4-Port, 100BASE-T1 to 100BASE-TX Automotive Ethernet Interface Device—The IVN-8561 is an interface that converts 100BASE-T1 unshielded twisted pair (UTP) automotive Ethernet to standard 100BASE-TX Ethernet. It is ideal for developing applications that require automotive Ethernet to test and validate automotive electronic control units (ECUs). The IVN-8561 provides two channels to convert data between 100BASE-TX Ethernet and 100BASE-T1 Automotive Ethernet. Each 100BASE-T1 port can be configured as master or slave, using switches on the front panel. The IVN-8561 also provides LED on the front panel so that you can monitor the linkage and activity on the various ports.
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Powered Device Analyzer for 802.3at & 802.3bt
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The One-Box solution for 802.3 Ethernet Powered Device testing and verification including flexible emulation of PSE behaviors, scalable feature configurations, and plug’n play testing using a Windows PC.
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Plug Pin Durability Test Device
IEC60884 Fig30
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig30 plug pin durability test deviceSuitable for checking the tightness of the plug pin,Check the tightness of the plug pin according to the standard, and customize the pin hole gauge of other national standards.
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Timing Devices (Crystal Unit / Ceramic Resonator)
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Timing devices are passive component which creates clock signal by the piezoelectric effect. This device is used for various applications, including for mobile phones, wearable devices and AV/PC.
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Standard Test Devices
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Zhengzhou SMS Electric Co.,Ltd
Fast, accurate verification to ensure that all devices work reliably.
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Power Device Analyzer / Curve Tracer
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The B1505A Power Device Analyzer / Curve Tracer is focused on the needs of power device manufacturers, while the B1506A Power Device Analyzer for Circuit Design is focused on the needs of power electronics circuit / product manufacturers. The B1507A Power Device Capacitance Analyzer helps both power device development engineers and power circuit designers maximize product value by revealing device capacitance characteristics.
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DRAM SO-DIMM DDR4 Memory
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Improve performance up to 50% (compared to SO-DDR3.) with Advantech! We offer industrial grade SO-DDR4 2666/2400/2133 memory with 30μ" gold plating connector (260 pin) featuring 1.2v low operating voltage with faster burst accesses.
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Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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PXI/PXIe High-Accuracy Multi-Measurement Device
PXM(e)7822
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The PXM Multi-Measurement Devices combine the functionalities of a 16 Bit digitizer, a 24 Bit multimeter, a timer/counter and a highly flexible trigger matrix in a PXI or PXIe device.
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Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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DC High-Voltage Test Device
PGK 25
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Cable testing with the BAUR PGK 25. Cables must be tested in compliance with the national and international standards. This applies before the commissioning of new cable networks. The portable BAUR PGK 25 cable test device is used for DC voltage testing in low- and medium-voltage cables. It is characterised by its low weight of only 16.5 kg, by the easy operation and solid construction for onsite use.* Compact device for DC voltage testing with negative polarity* Continuously adjustable output voltage* Perfect for mobile use
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DRAM Memory Module
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Choose the perfect memory solution for your application with Advantech! We offer a full range of industrial-grade RAM memory modules, covering all technologies including DDR4, DDR3, DDR2, DDR with diverse features like Unbuffered, Registered, and ECC.
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PCI-6601, 5 V, 4-Channel Counter/Timer Device
777918-01
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The PCI‑6601 performs encoder position measurements, event counting, period measurements, pulse-width measurements, pulse generation, pulse-train generation, and frequency measurement. It features four counter/timers, digital debouncing … filters, and TTL/CMOS-compatible digital I/O. The PCI‑6601 can perform one high-speed DMA transfer.
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Sofar’s Marine Sensing Devices
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At Sofar, we’re bringing you the highest-quality marine sensing devices at the lowest cost, ready to deliver the ocean data you need. Weather-tested, environmentally safe, and easy to use, Spotter + Smart Mooring is your one-stop solution for ocean research and innovation.
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Atlas UVTest Flourescent UV Condensation Weathering Device
M029
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Atlas UVTest Flourescent UV Condensation Weathering Device - STANDARD TESTER WITH IRRADIANCE CONTROL -
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Electricity Metering Device- Residential
ES-12B
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Designed for the residential smart meter rollout in Great Britain, this 5 terminal single phase electricity meter is an addition to our range of SMETS2 compliant solutions.With two 100A main disconnect relays, dedicated secure microcontroller and multiple communications interfaces including Zigbee and DLMS, the ES-12B is accurate and can operate in prepayment mode.
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Passive Tapping Device
DSL Phantom™
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DSL Phantom™ is a unique passive tapping device for Lawful Interception (LI) of ADSL lines. The device records and stores broadband digital information, offering unique advantages to Law Enforcement Authorities (LEAs) looking to capture data between the target and the service provider premises.
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Fault Detection Device in PV String
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Hanwa Electronic Ind. Co.,Ltd.
◆Very light and easy to carry.◆Possible to find fault areas that can’t find by Voc.◆Measurement Voc and Vc.◆Possible to check data and record the data using Android.
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USRP Software Defined Radio Stand-Alone Device
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The USRP Software Defined Radio Stand-Alone Device consists of an onboard processor, FPGA, and RF front end. You can program this device using either LabVIEW Communications System Design Suite or an open-source software workflow, depending on the operating system you choose. You can provision the device with NI Linux Real-Time, Linux Fedora, or Linux Ubuntu real-time operating systems. The USRP Software Defined Radio Stand-Alone Device enables you to prototype a range of advanced research applications such as stand-alone LTE or 802.11 device emulation; Medium Access Control (MAC) algorithm development; multiple input, multiple output (MIMO); heterogeneous networks; LTE relaying; RF compressive sampling; spectrum sensing; cognitive radio; beamforming; and direction finding.The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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A/D MODULE OF THE COMPACT DEVICE FAMILY
ES610
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This module measures analog voltages using 16 electrically insulated measuring channels at the adjustable acquisition rate per module of max. 2k samples/s, min. 0.5 samples/s. Signal smoothing occurs through a parameterized software filter, and 16- bit resolution ensures high measurement accuracy. Selectable measuring ranges are 10 V and 60 V. Data transfer to PC occurs via Ethernet.
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16G R-DDR4-3200 1GX8 1.2V Samsung Chip -40~85C
AQD-D4U16R32-SEW
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Registered DIMM, 30u" Gold Plating Thickness, Anti-sulfurization resistance. 1.2V power consumption, Samsung original chip, wide temperatures from -40° to 85°C.
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Radiation Survey Device
DRG-T
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The DRG-T radiation survey device is designed for use in special-purpose vehicles for continuous control and measurement of exposure dose rate (EDR) of gamma and X-ray radiation, as well as for providing audio and visual alarm of its dangerous levels and for issuing commands to start the actuators of protection equipment.
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DC High-Voltage Test Device
PGK 80
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Cable testing and diagnostics with the BAUR PGK 80. The portable, one-piece PGK 80 high-voltage test device for generating negative DC voltage up to 80 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
