Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
-
Product
Regenerative Power System, 80 V, ±125 A, 5 KW, 200/208 VAC
RP7932A
-
The Keysight RP7932A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
-
Product
Solderability Tester
LBT210
-
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
-
Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
-
The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
-
Product
Test Fixture Kits
-
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
Product
PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
-
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
-
Product
4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
-
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
-
Product
PXIe Digital I/O: 28 LVDS Channels, 8 Trigger Channels
M5302A
-
M5302A is a single-slot Digital IO PXIe module with 28 programmable LVDS channels and 8 single-ended channels. The LVDS channels can be used to communicate to the device under test or can be used to control other devices by emulating protocols such as Camera Link. The single-ended channels are suitable for event triggers or other general-purpose IO applications.
-
Product
sbRIO-9229 , Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780874-01
-
Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9229 performs differential analog input. The sbRIO‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Non-enclosed modules are designed for OEM applications.
-
Product
PCIe 6.0 Protocol Test Backplane
P5563B
-
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
-
Product
Pneumatic Test Pump Kit
700HPPK
-
The Fluke Calibration 700HPPK Pneumatic Test Pump Kit generates and adjusts pneumatic pressures up to 21 MPa (3000 psi), without requiring a nitrogen bottle or other external pressure supply. It supplies pressure to devices under test (DUTs) that include transmitters, controllers, pilots, digital and analog gauges, and more. It’s the perfect solution for generating high pressure in the field, where conditions and operating surfaces can vary. The 700HPPK is the ideal choice for calibration technicians, test engineers, and instrument technicians working in industries like natural gas transmission and distribution, process, aerospace and defense, who need a simple-to-use, safe and portable pressure source that they can depend on in a wide variety of conditions.
-
Product
PXI 2 Pole 18 way Mux with 2 Pole 18 way sen
40-658-002
-
This PXI multiplexer combines a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in one convenient single slot PXI module.The module is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test. This multiplexer is also convenient for making 4 wire low resistance measurements by supplying the resistor under test with high current through the power MUX and sensing the voltage drop through the sense MUX.
-
Product
AC Voltage Proving Units
HLV-2
-
Standard Electric Works Co., Ltd
The AC Voltage Detectors and AC Voltage Testers utilized to determine if the devices under test are functionally working. They are not a calibrator and cannot be utilized for calibration.
-
Product
Three-Phase compact Electric Power/Energy
MC133C
-
The Model MC133C is a compact single housed three phase electric power/energy calibrator. It can supply the device under test with precision one phase AC voltage and current with calibrated phase shift along with DC voltage and current. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A.
-
Product
Test Leads Adapter Sets
-
A physical device used to connect electronic test equipment to a device under test.
-
Product
Test Probes
-
A physical device used to connect electronic test equipment to a device under test (DUT).
-
Product
RF / MW switch
-
The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.
-
Product
Power Quality Analyzer
PQM-711
-
PQM-711 power quality analyzer is an advanced product for wide type of measurements, analysis and recording of network parameters 50/60 Hz and the power quality diagnostic according to European standard EN 50160. PQM-711 is an innovative model with a wireless communication Wi-Fi , which allows for automatic pairing with the included tablet, with a large 10" touch screen. Tablet allows full operating of the analyzer, live data preview and the reading and analysis of data stored in the internal memory. With this solution, the PQM-711 is an unique device that combines the advantages of the analyzer with built-in display and typical portable analyzers (known as Black Boxes).With the tablet you can very fast checked the device under test. On the other hand, you can leave the analyzer module for multi-measurements as a typical logger without display. You can very fast diagnose the machine under test using the tablet. On the other hand, you can leave the analyzer module itself for many days measurement as a typical logger without display. PQM-711 has a transient registration with a maximum sampling rate of 10 MHz (rapid changes in voltage) and control signals. The minimum duration of the registered transient is 650 ns.
-
Product
Kelvin Test Contactor/Probe Head
Gemini
-
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
-
Product
Pod/Nest Fixtures
-
Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing. Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.
-
Product
Long Wavelength Optical Spectrum Analyzer 1200 To 2400 Nm And 1000 To 2500 Nm
AQ6375E
-
Due to the high resolution and sensitivity of the AQ6375E, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
-
Product
PathWave Lab Operations For Battery Test
EP1150A
-
PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
-
-
Product
Multiplexers
-
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
-
Product
PXI Programmable Power Supply
-
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
-
Product
Plane Wave Converter
PWC200
-
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
-
Product
PXIe-4140, 4-Channel Source Measure Unit
781742-01
-
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
-
Product
Automated Optical Inspection (AOI)
-
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
-
Product
Hand Held Test Fixtures
-
Manual, or semi-automated mechanical devices designed to secure a Device Under Test (DUT) and provide a stable interface for electrical testing, inspection, or programming.
-
Product
HTOL Test Systems
-
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
-
Product
Functional Test
xUTS
-
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
