X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Industrial CT X-Ray Inspection System
X5000
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The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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Product
Beam Directional Power Supply Battery 40 to 160 kV
CP160B
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Next to the CP120B, the CP160B is the slightly more powerful version of our ultra-light, compact and battery operated constant potential portable X-Ray generators. Allowing penetration reaching up to 30 mm for steel, the CP160B is the perfect tool for specific NDT applications that require repetitive short exposures, as well as security applications.
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Real-time X-ray Inspection Systems
JewelBox Series
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JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
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Radiation Detectors
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High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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Product
Handheld/Mobile/Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Product
Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Product
High Voltage Film Capacitor
STHVP/STHVE
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High Voltage Pulse Current for medium frequency applicationHigh Voltage DC / AC Voltage applicationCapacitor can be discharged at rated voltage directly without any protective component and with ambient Temperature up to +105CHigh Voltage Decoupling and SnubberingVoltage MultiplierInduction heatingAct as discharge capacitor to trigger laser, X-Ray and Tesla CoilFor high voltage capacitor bank or arrayHigh Voltage Power Supplies
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Product
LIXI WorkStation
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The LIXI WorkStation utilizes real-time xray to provide a cost effective solution for a variety of inspection needs. The system features a mobile cabinet for ultimate portability within your facility, while providing the operator with a high degree of safety.
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Product
3D X-ray hybrid inspection system
YSi-X
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Ideal for 100% inspection of onboard automotive products and many other items by 3D X-rays acquire layered of target. X-ray, optical, infrared, and laser height measurement as standard equipment; hybrid and high reliability with multiple inspection modes.
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Product
High Speed Inline AXI Platform
AXI X Series
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The X-platform series is a dedicated high speed inline automated X-ray inspection system for the inspection of PCB-assembly boards for single/multipanels or samples in trays. The system offers market leading inspection speed and is ideal for low-mix high-volume production environment.
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Product
Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Product
Detector Subsystem
Aurora CT
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Aurora CT is the industry’s first off-the-self detector subsystem for security CT applications. The plug-and-play-type solution includes ready-made, multislice detector boards, a control unit and a software library. Aurora CT speeds up time-to-market and decreases total costs of X-ray imaging systems that meet the most stringent security equipment standards in aviation.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
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Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Flat Panel Detectors
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Are a class of solid-state x-ray digital radiography devices similar in principle to the image sensors used in digital photography and video.
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Personal Alarm
ND-20
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Rugged Die Cast Aluminum Belt Worn Personal Alarm, Dual Range for Beta, Gamma and X-Ray
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Data Acquisition Control Boards
X-GCU
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X-GCUs are a data acquisition and control boards of Detection Technology’s digital X-ray detector platforms. X-GCU together with the digital X-Cards provide complete and easily scalable detector subsystems shortening time-to-market and delivering total cost savings for all types of X-ray imaging systems.
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Product
X-ray Inspection System
NEO-690Z / NEO-890Z
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Off-line Microfocus X-ray Inspection System equipped with PONY ORIGINAL Direct Conversion X-ray Camera; SID-A50. Suitable for inspection of BGA, CSP, and LGA on PCB.
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X-Scan T
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The X-Scan T series is a product family of TDI (Time Delay Integration) technology-based X-ray line cameras that are optimized for demanding industrial environments.
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elemental analyzer
SPECTRO XEPOS
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SPECTRO Analytical Instruments GmbH
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance
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Product
Entry-level X-ray Inspection System
X-eye 5100 Series
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100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Metrology System
Aspect
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Memory density increases with both layer-pair scaling and tier stacking for memory stacks well over 200 pairs. The Aspect metrology system was designed with these future architectures and scaling strategies in mind. Aspect metrology is demonstrating performance superior to X-ray systems across multiple customer devices through a revolutionary infrared optical system providing full profiling capability to enable critical etch and deposition control, with the speed and process coverage that customers require.
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Product
Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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XRF Spectrometers
Epsilon Range
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The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.





























