Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Product
Burn-In Boards
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Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200 C maximum temperature. Gold-plated connectors.
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Product
Production Wafer Level Burn-in
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TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Burn-in Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's High Temperature Aging Chamber is widely applied for automotive parts ,electronic and electric products ,components and materials by constant high temperature reliability test.
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Product
Burn-In Test
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C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
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Product
Burn-in Room and Aging Test Chamber
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Aging test room according to your requirements. More types of Burn-In Test Room, Burn-In Chamber, Burn-In Test Oven wanted, please contact us freely.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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High Power Burn-In Test
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Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Product
Burn-in or Rapid Temperature Cycling Chamber
KDL Series
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The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor.
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Product
Advanced Burn-in and Test System for packaged parts
ABTS-Li
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High power logic individual temperature control
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Product
Laser Diode Burn-In Testing
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Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Product
Multiple Channel Burn In Power Supply
MCPS
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The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Product
Burn-In Test Sockets
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The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Burn-in System
Sonoma
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High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Product
Burn-in and Stress Screening Chambers
KDR
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Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Product
Electric Burn-in Board Carts
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Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
300mm Single Touchdown Burn-in and Test System
FOX-15
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Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Product
Low Voltage Burn-in and Test System
Max 450
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For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
BGA Sockets
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Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Automated Production Testing
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Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests.
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Product
Multisystem Ignition Analyzer
TA500
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The TA500''s unique and proprietary technology allows the user to perform quick and reliable diagnostics of non-starts, misfires, fouled up or damaged spark plugs and/or spark plug wires, by comparing digital read-outs of the spark plug voltage and spark burn time between cylinders on engines using Coil on Plug, Coil near Plug, conventional distributor/ignition coil, DIS (Distributor-less) or waste spark and magneto technologies.
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Product
RF Burn-In Services
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Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
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Environmental Test Chamber
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High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
