Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
-
Product
Device Parameter Analysis
-
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
-
Product
Cleanroom Monitoring System
CRMS
-
The Kanomax Cleanroom Monitoring System offers turnkey solutions for monitoring needs required by various industries such as pharmaceutical, medical device, aerospace, semiconductor, and automotive.
-
Product
Single And Dual 32k Digital MCA & Pulse Processor
Hexagon Family
-
Hexagon is a high precision 32k MCA available in single and dual input channel versions. This compact, high performance desktop MCA includes features such as an input stage for signal conditioning, a fast analog-to-digital converter (ADC), digital signal processing algorithms, High Voltage and Preamplifier outputs for detector bias and preamp power. Hexagon is ideally suited for applications using high energy resolution semiconductor detectors such as HPGe, Silicon, CZT as well as scintillation detectors such as NaI and LaBr3. It can manage both positive and negative signals from resistive feedback or transistor reset preamplifier detectors as well as signals coming from PMT anodes.
-
Product
Laser Systems
-
We offer a full line of complete laser micro-machining heads for semiconductor applications. These systems feature an integrated DPSS Jewel ND:Yag laser incorporated into a uni-body all-in-one form factor. They also have a robust mechanical and optical design for manufacturing and repair applications. Our three models of micromachining heads are diverse enough to adjust to a variety of applications including: ablation, semiconductor FA, TFT/LCD, CF and cell LCM, and OLED repair.
-
Product
Non-Linear Junction Detector
ORION™ HGO-4000
-
The ORION HGO-4000 is REI’s original high gain Non-Linear Junction Detector for special applications. The ORION HGO-4000 can locate listening devices and semiconductors in walls floors, ceilings, fixtures, furniture or containers and provides a user the capability to detect hidden electronic devices, regardless of whether the device is radiating, hard wired, or even turned off.
-
Product
6kW Regenerative DC Electronic Load (CC/CR/CV/CP/CC+CV/CR+CV)
PLZ6000R
-
PLZ6000R is a DC electronic load that regenerates load power to the AC line. Regular electronic loads consume load power by having semiconductor devices convert it into heat. By contrast, PLZ6000R converts load power into reusable electric power, rather than converting it into heat as is typically done, and feeds this power to the AC line, thereby substantially reducing the amount of waste energy. PLZ6000R is an environment-friendly electronic load that can contribute significantly to your energy saving efforts.
-
Product
Low-leakage Switch Matrix Family
-
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
-
Product
Thermo-hygrometer Handheld Temperature And Humidity Meter
HW100
-
Shenzhen Chuangxin Instruments Co., Ltd.
HW100 temperature humidity meter is a portable temperature humidity test instrument., selecting high performance capacitor type polymer film humidity sensor and semiconductor type temperature sensor. It has features of volume small, weight light, easy carrying, multi-function, and high precision, etc., applies to various fields such as hot comfortable research, indoor air quality assessment, verification of HVAC system run situation in building, heating and refrigeration system overhaul, and detection of the air conditioning system during the production process and so on.
-
Product
ReferenceWafer
RW10
-
Materials Development Corporation
MDC presents the RW10 Reference Wafer. A range of capacitors, resistors and semiconductor devices can bemeasured to verify the repeatability and accuracy of measurement systems. The MDC Model RW10 Reference Wafer is not actually a "wafer". It has the shape of a wafer and it includes capacitors, resistors, MOS devices, and a junction device in a wafer configuration to allow rapid verification of proper operation for capacitance-voltage and current-voltage instrumentation.
-
Product
Pattern Region of Interest Analysis System
PRIAS
-
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
-
Product
1.3 MP Global Shutter Camera (Monochrome / Color (RAW Bayer))
See3CAM_10CUG
-
The See3CAM_10CUG is a 1.3 MP Custom Lens CMOS USB Global Shutter Camera Module. This is a S/CS/C Mount global shutter camera and is UVC-compliant SuperSpeed USB 3.0 Camera. It is based on the Aptina / ON Semiconductor AR0134 CMOS sensor. See3CAM_10CUG is also backward compatible with USB 2.0 host ports and does not require any special camera drivers.
-
Product
Non-Linear Junction Detector
ORION™ 900 HX
-
The ORION 900 HX Non-Linear Junction Detector (NLJD) detects electronic semi-conductor components through dense materials such as bricks, concrete, and soil. The ORION 900 HX NLJD is made to detect and locate hidden cameras, microphones, and other electronic devices regardless of whether the surveillance device is radiating, hard wired, or turned off.
-
Product
High Voltage ICs
-
Hitachi Power Semiconductor Device offers intelligent power devices and high voltage analog switch ICs integrating high voltage output devices and control circuits on a single chip/single package using dielectric isolation technology. *High voltage ICs are suitable for household apparatus fields such as home electric appliances and beauty appliances.* These ICs can be easily used for various purposes, and market-leading companies in air conditioner fan motors have adopted them.※We have continued to improve performance and quality of the ICs since sales start in 1994 and have more than 20 years of sales results.
-
Product
X-ray Inspection System
Cougar ECO / Cheetah ECO
-
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
-
-
Product
13MP 4K Camera Module
e-CAM131_CUMI1335_MOD
-
e-CAM131_CUMI1335_MOD is a high performance, 13 MP 4K camera module with S-Mount lens holder and it has better low light performance. This small form factor 4K camera module is based on 1/3.2” AR1335 CMOS image sensor from ON Semiconductor® and has a dedicated, high-performance Image Signal Processor (ISP) that performs the entire Auto functions like auto white balance, auto exposure control in addition to complete image signal processing pipeline that provides best-in-class images and video and the optional MJPEG compression.
-
Product
Caibration Equipment For Lab Use
-
In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
-
Product
Calibration Services
-
For over 25 years, OAI (Optical Associate Inc.), is the leader in NIST traceable calibration of instruments for measuring Ultra Violet (UV) light. Originally designed to meet the demanding needs of the semiconductor wafer fabrication industry, OAI developed the most repeatable NIST traceable calibration in the industry.
-
Product
MASK MVM-SEM® E3600 Series
E3640
-
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.
-
Product
Backgrinding & Stress Relief
-
Grinding and Dicing Services, Inc.
GDSI delivers complete backgrinding solutions to the semiconductor, MEMS and biomedical industries. Backgrinding is a necessary process step to reduce wafer thickness prior to dicing and final assembly. By utilizing fully automated grinders staffed by highly qualified engineers, GDSI’s grinding procedures produce unsurpassed precision and repeatability.
-
Product
EEE Component Testing and Screening Services
-
DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
-
Product
WATOM
-
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
-
Product
Bi-Potentiostat
2325
-
Model 2325 is a very low-price and high-performance Bi-Potentiostat based on modern semiconductor circuity and advanced software technology. Low noise, high speed and small space measurement were considerate for the development of Model 2325. The user-friendly interface is designed for supporting wide applications. Model 2325 can be applied in various experiments, such as RRDE, sensor development and spectroelectro-chemical measurements, etc. It can be not only applied for research purpose, but also for student experiments and industrial applications due to the low-price and high-performance.
-
Product
PXI Switched Guard Reed Relay Module, 8x 2:1 Multiplexer
40-121-012
-
The 40-121-012 provides 8x 2:1 multiplexers in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
-
Product
High Purity Germanium (HPGe) Radiation Detectors
-
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
-
Product
Multifunction Instrument for Education and Training
LabXplorer
-
LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.
-
Product
Spectrometer - OSA
-
HighFinesse optical spectrometers LSA and HDSA are designed to analyse the multi-line or broadband spectrum of (un-)known light sources like cw and pulsed lasers, gas discharge lamps, super luminescence diodes, semiconductor laser diodes and LEDs. They are suitable to analyze the spectrum of telecom signals, resolve Fabry-Perot modes of a gain chip, and produce a spectral measurement of gas absorption.
-
Product
High-resolution, SWIR InGaAs camera
Wildcat+ 640 Series
-
The Wildcat+ 640 series is based upon a state-of-the-art InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The camera offers superior, high resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 camera outputs full frame images up to 300 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 is suitable for semiconductor inspection, display inspection (mobile phone and TV), and laser beam analysis.Benefits & Features- Compact and industry-proven camera design- High-resolution SWIR imaging- Advanced on-board image processing performance- GenICam complaint- Flexible optical mount and lens options
-
Product
Sheet Resistance Measurement
-
The Filmetrics® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
-
Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
-
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
